TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_22_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-020-12 | FUSED_ID : 6359364768384454988
  IC_TEMP :  -60.30 | VDDM : 1123.90 | AUX_INT :  -10.40 | CsaBias :   71.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80619e-03 / 2
  ADC_P0  : -1.03987e-02 ± 2.88278e-02
  ADC_P1  : 8.25049e-03 ± 6.87653e-04
  ADC_P2  : -5.74610e-06 ± 3.26979e-06
  CSA_Chi2/NDF : 1.07749e-04 / 2
  CSA_P0  : 6.15709e-02 ± 6.92354e-03
  CSA_P1  : 9.98362e-03 ± 5.21639e-04
  CSA_P2  : -5.13902e-05 ± 7.94394e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [38, 39, 40, 43, 50, 51, 57, 61, 67, 71, 80, 84, 86, 89, 97, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [6, 9, 10, 44, 47, 48, 71, 81, 84, 88, 110, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2516', '1.800', '0.1543', '1.799', '0.0948', '7.000', '0.7080', 1, 1, 1, 1, 1724325732.0040689]
VI_after__Init : ['1.201', '0.2517', '1.800', '0.1543', '1.801', '0.0890', '7.000', '0.7082', 1, 1, 1, 1, 1724325740.0904608]
VI_at__the_End : ['1.201', '0.4830', '1.800', '0.1377', '1.803', '0.1167', '7.000', '0.7086', 1, 1, 1, 1, 1724325799.1039598]