TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_14_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-025-12 | FUSED_ID : 6359364768384455068
  IC_TEMP :  -67.28 | VDDM : 1134.54 | AUX_INT : -155.90 | CsaBias :  -70.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39392e-03 / 2
  ADC_P0  : -1.55902e-01 ± 3.32332e-02
  ADC_P1  : 1.07262e-02 ± 7.80278e-04
  ADC_P2  : -1.38627e-05 ± 3.60525e-06
  CSA_Chi2/NDF : 1.55891e-04 / 2
  CSA_P0  : 5.90161e-02 ± 8.32786e-03
  CSA_P1  : 1.03597e-02 ± 6.27444e-04
  CSA_P2  : -5.83165e-05 ± 9.55523e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [6, 11, 26, 36, 64, 75, 79, 85, 90, 92, 93, 99, 121, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [3, 11, 12, 35, 36, 41, 44, 54, 60, 81, 87, 89, 99, 101, 105, 106, 122, 123, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2545', '1.800', '0.1391', '1.799', '0.0901', '7.000', '0.7080', 1, 1, 1, 1, 1724325260.0485253]
VI_after__Init : ['1.201', '0.2545', '1.800', '0.1392', '1.799', '0.0842', '7.000', '0.7079', 1, 1, 1, 1, 1724325268.774913]
VI_at__the_End : ['1.201', '0.4767', '1.800', '0.1372', '1.808', '0.1185', '7.000', '0.7089', 1, 1, 1, 1, 1724325334.4908664]