TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_12_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-026-12 | FUSED_ID : 6359364768384455084
  IC_TEMP :  -72.16 | VDDM : 1129.60 | AUX_INT :  -10.18 | CsaBias :   59.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.87987e-03 / 2
  ADC_P0  : -1.01793e-02 ± 2.94432e-02
  ADC_P1  : 8.70951e-03 ± 7.47243e-04
  ADC_P2  : -6.18377e-06 ± 3.77658e-06
  CSA_Chi2/NDF : 1.87555e-04 / 2
  CSA_P0  : 6.22798e-02 ± 9.13454e-03
  CSA_P1  : 1.09359e-02 ± 6.88222e-04
  CSA_P2  : -6.85431e-05 ± 1.04808e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [4, 7, 12, 23, 26, 30, 45, 65, 79, 81, 93, 103, 113, 118, 122, 123, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [15, 26, 37, 43, 48, 59, 69, 76, 90, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4332', '1.800', '0.1241', '1.800', '0.1033', '7.000', '0.7079', 1, 1, 1, 1, 1724325164.644561]
VI_after__Init : ['1.202', '0.4333', '1.800', '0.1241', '1.800', '0.0972', '7.000', '0.7077', 1, 1, 1, 1, 1724325172.7410443]
VI_at__the_End : ['1.202', '0.4718', '1.800', '0.1384', '1.805', '0.1208', '7.000', '0.7090', 1, 1, 1, 1, 1724325239.763033]