TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_11_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-009-027-12 | FUSED_ID : 6359364768384455100
  IC_TEMP :  -64.37 | VDDM : 1126.99 | AUX_INT :   -9.45 | CsaBias :   65.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55130e-03 / 2
  ADC_P0  : -9.44551e-03 ± 2.66982e-02
  ADC_P1  : 8.33732e-03 ± 6.45609e-04
  ADC_P2  : -5.94554e-06 ± 3.10004e-06
  CSA_Chi2/NDF : 2.02165e-04 / 2
  CSA_P0  : 5.71039e-02 ± 9.48365e-03
  CSA_P1  : 1.01098e-02 ± 7.14525e-04
  CSA_P2  : -5.39491e-05 ± 1.08814e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [21, 25, 32, 36, 70, 86, 88, 92, 102, 103, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [1, 6, 11, 16, 28, 33, 39, 41, 50, 58, 60, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4728', '1.800', '0.1230', '1.800', '0.0975', '7.000', '0.7080', 1, 1, 1, 1, 1724325069.2045722]
VI_after__Init : ['1.201', '0.4737', '1.800', '0.1231', '1.800', '0.0920', '7.000', '0.7079', 1, 1, 1, 1, 1724325077.2400897]
VI_at__the_End : ['1.202', '0.4767', '1.800', '0.1331', '1.805', '0.1184', '7.000', '0.7087', 1, 1, 1, 1, 1724325139.0084438]