TEST_NAME : Wafer
TEST_DATE : 24_08_22-13_55_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-010-004-05 | FUSED_ID : 6359364768384458821
  IC_TEMP :  -63.82 | VDDM : 1104.84 | AUX_INT :   -9.34 | CsaBias :   70.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44521e-03 / 2
  ADC_P0  : -9.33645e-03 ± 2.57549e-02
  ADC_P1  : 8.96668e-03 ± 6.69913e-04
  ADC_P2  : -6.84185e-06 ± 3.46383e-06
  CSA_Chi2/NDF : 2.56341e-04 / 2
  CSA_P0  : 5.99048e-02 ± 1.06790e-02
  CSA_P1  : 1.02059e-02 ± 8.04587e-04
  CSA_P2  : -5.75087e-05 ± 1.22529e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [5, 8, 9, 15, 27, 36, 71, 74, 80, 89, 91, 92, 101, 106, 109, 110, 112, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [12, 16, 20, 28, 35, 41, 44, 61, 78, 79, 81, 83, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3871', '1.800', '0.1623', '1.799', '0.0961', '7.000', '0.7077', 1, 1, 1, 1, 1724327735.2368512]
VI_after__Init : ['1.201', '0.3865', '1.800', '0.1613', '1.801', '0.0905', '7.000', '0.7078', 1, 1, 1, 1, 1724327743.3731842]
VI_at__the_End : ['1.201', '0.4681', '1.800', '0.1411', '1.808', '0.1187', '7.000', '0.7084', 1, 1, 1, 1, 1724327808.5261166]