TEST_NAME : Wafer
TEST_DATE : 24_08_22-14_05_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-010-010-05 | FUSED_ID : 6359364768384458917
  IC_TEMP :  -62.51 | VDDM : 1122.33 | AUX_INT :   -7.87 | CsaBias :   67.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40086e-03 / 2
  ADC_P0  : -7.87251e-03 ± 2.54145e-02
  ADC_P1  : 8.39556e-03 ± 6.34892e-04
  ADC_P2  : -5.12866e-06 ± 3.16101e-06
  CSA_Chi2/NDF : 1.78383e-04 / 2
  CSA_P0  : 6.04431e-02 ± 8.90838e-03
  CSA_P1  : 1.00438e-02 ± 6.71182e-04
  CSA_P2  : -5.68624e-05 ± 1.02213e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [3, 28, 31, 34, 37, 59, 61, 66, 67, 69, 77, 106, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [7, 9, 16, 19, 42, 64, 91, 107, 111, 112, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3369', '1.800', '0.1615', '1.799', '0.0978', '7.000', '0.7078', 1, 1, 1, 1, 1724328307.0414011]
VI_after__Init : ['1.202', '0.3374', '1.800', '0.1618', '1.800', '0.0918', '7.000', '0.7076', 1, 1, 1, 1, 1724328315.8867135]
VI_at__the_End : ['1.201', '0.4645', '1.800', '0.1387', '1.799', '0.1185', '7.000', '0.7085', 1, 1, 1, 1, 1724328383.9064646]