TEST_NAME : Wafer
TEST_DATE : 24_08_22-14_11_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-010-014-05 | FUSED_ID : 6359364768384458981
  IC_TEMP :  -62.21 | VDDM : 1125.43 | AUX_INT :   -9.07 | CsaBias :   74.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36045e-03 / 2
  ADC_P0  : -9.07194e-03 ± 2.49733e-02
  ADC_P1  : 8.45496e-03 ± 6.10971e-04
  ADC_P2  : -6.23622e-06 ± 2.96550e-06
  CSA_Chi2/NDF : 1.45430e-04 / 2
  CSA_P0  : 5.95025e-02 ± 8.04357e-03
  CSA_P1  : 9.88983e-03 ± 6.06025e-04
  CSA_P2  : -5.07738e-05 ± 9.22904e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [4, 14, 43, 45, 48, 58, 60, 69, 77, 81, 83, 85, 90, 106, 109, 114, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [11, 12, 18, 21, 26, 47, 70, 77, 78, 83, 90, 92, 104, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2294', '1.800', '0.1517', '1.799', '0.0887', '7.000', '0.7075', 1, 1, 1, 1, 1724328688.3226967]
VI_after__Init : ['1.201', '0.2296', '1.800', '0.1516', '1.801', '0.0829', '7.000', '0.7075', 1, 1, 1, 1, 1724328696.4501295]
VI_at__the_End : ['1.202', '0.4768', '1.800', '0.1394', '1.803', '0.1141', '7.000', '0.7081', 1, 1, 1, 1, 1724328766.5990798]