TEST_NAME : Wafer
TEST_DATE : 24_08_22-14_13_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-010-015-05 | FUSED_ID : 6359364768384458997
  IC_TEMP :  -59.25 | VDDM : 1102.21 | AUX_INT :   -9.11 | CsaBias :   74.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33944e-03 / 2
  ADC_P0  : -9.11245e-03 ± 2.47874e-02
  ADC_P1  : 8.43688e-03 ± 6.08364e-04
  ADC_P2  : -5.96505e-06 ± 2.96938e-06
  CSA_Chi2/NDF : 1.08573e-04 / 2
  CSA_P0  : 5.89207e-02 ± 6.94998e-03
  CSA_P1  : 9.56662e-03 ± 5.23631e-04
  CSA_P2  : -4.72257e-05 ± 7.97428e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [14, 28, 32, 41, 42, 74, 78, 80, 87, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  21
 | P_BROKEN_FAST :  [0, 5, 6, 7, 9, 10, 20, 29, 30, 59, 60, 61, 67, 70, 74, 89, 98, 107, 110, 115, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2683', '1.800', '0.1557', '1.800', '0.0903', '7.000', '0.7082', 1, 1, 1, 1, 1724328783.9539788]
VI_after__Init : ['1.201', '0.2683', '1.800', '0.1557', '1.801', '0.0828', '7.000', '0.7074', 1, 1, 1, 1, 1724328792.1423519]
VI_at__the_End : ['1.201', '0.4711', '1.800', '0.1377', '1.800', '0.1149', '7.000', '0.7081', 1, 1, 1, 1, 1724328860.2646298]