TEST_NAME : Wafer
TEST_DATE : 24_08_22-14_27_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-010-024-02 | FUSED_ID : 6359364768384459138
  IC_TEMP :  -55.57 | VDDM : 1122.73 | AUX_INT :   -9.24 | CsaBias :   64.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33868e-03 / 2
  ADC_P0  : -9.23670e-03 ± 2.47720e-02
  ADC_P1  : 8.28961e-03 ± 5.95701e-04
  ADC_P2  : -5.82427e-06 ± 2.84987e-06
  CSA_Chi2/NDF : 1.45582e-04 / 2
  CSA_P0  : 5.82223e-02 ± 8.04778e-03
  CSA_P1  : 9.94593e-03 ± 6.06342e-04
  CSA_P2  : -4.91480e-05 ± 9.23387e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [25, 26, 36, 42, 43, 57, 75, 93, 96, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [11, 30, 46, 59, 64, 72, 74, 77, 83, 88, 94, 98, 100, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3013', '1.800', '0.1450', '1.799', '0.0905', '7.000', '0.7078', 1, 1, 1, 1, 1724329643.411004]
VI_after__Init : ['1.202', '0.3012', '1.800', '0.1450', '1.801', '0.0849', '7.000', '0.7077', 1, 1, 1, 1, 1724329651.5674396]
VI_at__the_End : ['1.202', '0.4864', '1.800', '0.1371', '1.800', '0.1142', '7.001', '0.7084', 1, 1, 1, 1, 1724329717.0903502]