TEST_NAME : Wafer
TEST_DATE : 24_08_22-15_08_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-011-005-08 | FUSED_ID : 6359364768384462936
  IC_TEMP :  -61.51 | VDDM : 1131.39 | AUX_INT :   -8.86 | CsaBias :   66.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47291e-03 / 2
  ADC_P0  : -8.85687e-03 ± 2.60519e-02
  ADC_P1  : 8.42518e-03 ± 6.48647e-04
  ADC_P2  : -5.49028e-06 ± 3.21106e-06
  CSA_Chi2/NDF : 1.53064e-04 / 2
  CSA_P0  : 5.86577e-02 ± 8.25200e-03
  CSA_P1  : 9.92828e-03 ± 6.21729e-04
  CSA_P2  : -5.10109e-05 ± 9.46820e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [3, 14, 25, 43, 44, 51, 53, 56, 89, 110, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [25, 39, 44, 56, 62, 63, 76, 80, 88, 92, 96, 107, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3264', '1.800', '0.1550', '1.800', '0.0955', '7.000', '0.7072', 1, 1, 1, 1, 1724332126.8368113]
VI_after__Init : ['1.200', '0.3260', '1.800', '0.1550', '1.800', '0.0897', '7.000', '0.7070', 1, 1, 1, 1, 1724332135.1310966]
VI_at__the_End : ['1.193', '0.4716', '1.800', '0.1378', '1.805', '0.1162', '7.000', '0.7082', 1, 1, 1, 1, 1724332205.1045587]