TEST_NAME : Wafer
TEST_DATE : 24_08_22-14_54_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-011-014-08 | FUSED_ID : 6359364768384463080
  IC_TEMP :  -55.45 | VDDM : 1126.61 | AUX_INT :   -7.43 | CsaBias :   58.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.97250e-04 / 2
  ADC_P0  : -7.43452e-03 ± 2.13814e-02
  ADC_P1  : 8.31088e-03 ± 5.24129e-04
  ADC_P2  : -5.59260e-06 ± 2.54410e-06
  CSA_Chi2/NDF : 1.08880e-04 / 2
  CSA_P0  : 5.99366e-02 ± 6.95980e-03
  CSA_P1  : 9.85672e-03 ± 5.24371e-04
  CSA_P2  : -4.96625e-05 ± 7.98554e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [18, 19, 34, 51, 59, 61, 62, 66, 74, 101, 114, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [0, 9, 14, 15, 19, 23, 33, 35, 71, 72, 86, 96, 118, 121, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3236', '1.800', '0.1591', '1.800', '0.0907', '7.000', '0.7078', 1, 1, 1, 1, 1724331267.6751878]
VI_after__Init : ['1.202', '0.3233', '1.800', '0.1591', '1.800', '0.0832', '7.000', '0.7072', 1, 1, 1, 1, 1724331275.746489]
VI_at__the_End : ['1.201', '0.4803', '1.800', '0.1384', '1.800', '0.1135', '7.000', '0.7078', 1, 1, 1, 1, 1724331345.49365]