TEST_NAME : Wafer
TEST_DATE : 24_08_22-14_52_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-011-015-08 | FUSED_ID : 6359364768384463096
  IC_TEMP :  -54.66 | VDDM : 1125.37 | AUX_INT :   -7.24 | CsaBias :   72.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00461e-03 / 2
  ADC_P0  : -7.23842e-03 ± 2.14554e-02
  ADC_P1  : 8.01793e-03 ± 5.06204e-04
  ADC_P2  : -5.37670e-06 ± 2.35994e-06
  CSA_Chi2/NDF : 9.94355e-05 / 2
  CSA_P0  : 5.91006e-02 ± 6.65109e-03
  CSA_P1  : 9.49544e-03 ± 5.01112e-04
  CSA_P2  : -4.34368e-05 ± 7.63134e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [11, 14, 39, 44, 47, 71, 73, 93, 95, 97, 104, 112, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [2, 16, 25, 26, 27, 40, 46, 53, 79, 85, 107, 117, 121, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2673', '1.800', '0.1856', '1.800', '0.0913', '7.000', '0.7074', 1, 1, 1, 1, 1724331172.0261755]
VI_after__Init : ['1.201', '0.2675', '1.800', '0.1856', '1.799', '0.0856', '7.000', '0.7073', 1, 1, 1, 1, 1724331180.8365104]
VI_at__the_End : ['1.201', '0.4822', '1.800', '0.1377', '1.805', '0.1109', '7.000', '0.7080', 1, 1, 1, 1, 1724331249.5366778]