TEST_NAME : Wafer
TEST_DATE : 24_08_22-14_38_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-011-024-15 | FUSED_ID : 6359364768384463247
  IC_TEMP :  -51.55 | VDDM : 1123.85 | AUX_INT :   -8.55 | CsaBias :   65.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21515e-03 / 2
  ADC_P0  : -8.54755e-03 ± 2.36189e-02
  ADC_P1  : 8.22964e-03 ± 5.71021e-04
  ADC_P2  : -5.41393e-06 ± 2.74448e-06
  CSA_Chi2/NDF : 1.08381e-04 / 2
  CSA_P0  : 6.08425e-02 ± 6.94382e-03
  CSA_P1  : 9.97385e-03 ± 5.23167e-04
  CSA_P2  : -4.84517e-05 ± 7.96721e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [12, 31, 35, 39, 80, 84, 92, 99, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [1, 3, 10, 12, 13, 16, 35, 41, 44, 60, 64, 66, 79, 100, 105, 106, 117, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3431', '1.800', '0.1467', '1.799', '0.0966', '7.000', '0.7083', 1, 1, 1, 1, 1724330312.4535396]
VI_after__Init : ['1.201', '0.3434', '1.800', '0.1465', '1.801', '0.0910', '7.000', '0.7079', 1, 1, 1, 1, 1724330320.496993]
VI_at__the_End : ['1.201', '0.4941', '1.800', '0.1383', '1.803', '0.1113', '7.000', '0.7087', 1, 1, 1, 1, 1724330377.1496463]