TEST_NAME : Wafer
TEST_DATE : 24_08_22-14_36_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-011-025-15 | FUSED_ID : 6359364768384463263
  IC_TEMP :  -57.38 | VDDM : 1121.59 | AUX_INT :  -10.03 | CsaBias :   65.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48018e-03 / 2
  ADC_P0  : -1.00325e-02 ± 2.60540e-02
  ADC_P1  : 8.46164e-03 ± 6.40075e-04
  ADC_P2  : -5.81778e-06 ± 3.14441e-06
  CSA_Chi2/NDF : 1.36029e-04 / 2
  CSA_P0  : 5.94829e-02 ± 7.77925e-03
  CSA_P1  : 1.00476e-02 ± 5.86111e-04
  CSA_P2  : -5.01766e-05 ± 8.92577e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [7, 29, 50, 53, 54, 60, 96, 97, 98, 100, 101, 110, 113, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [22, 43, 57, 60, 63, 70, 73, 79, 96, 105, 114, 118, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3998', '1.800', '0.1794', '1.799', '0.1011', '7.000', '0.7090', 1, 1, 1, 1, 1724330216.9667535]
VI_after__Init : ['1.201', '0.4004', '1.800', '0.1797', '1.800', '0.0928', '7.000', '0.7079', 1, 1, 1, 1, 1724330225.7311192]
VI_at__the_End : ['1.201', '0.4868', '1.800', '0.1379', '1.804', '0.1137', '7.000', '0.7087', 1, 1, 1, 1, 1724330281.9758427]