TEST_NAME : Wafer
TEST_DATE : 24_08_22-14_33_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-011-027-15 | FUSED_ID : 6359364768384463295
  IC_TEMP :  -58.59 | VDDM : 1115.97 | AUX_INT :   -8.10 | CsaBias :   65.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10856e-03 / 2
  ADC_P0  : -8.10345e-03 ± 2.25119e-02
  ADC_P1  : 8.23729e-03 ± 5.36191e-04
  ADC_P2  : -6.09167e-06 ± 2.52600e-06
  CSA_Chi2/NDF : 1.22442e-04 / 2
  CSA_P0  : 5.56173e-02 ± 7.38052e-03
  CSA_P1  : 9.57426e-03 ± 5.56069e-04
  CSA_P2  : -4.64840e-05 ± 8.46828e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [13, 27, 33, 83, 110, 118, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [8, 25, 30, 43, 51, 52, 70, 82, 100, 109, 112, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1376', '1.800', '0.1422', '1.800', '0.0816', '7.000', '0.7079', 1, 1, 1, 1, 1724330026.1331172]
VI_after__Init : ['1.201', '0.1376', '1.800', '0.1421', '1.800', '0.0760', '7.000', '0.7079', 1, 1, 1, 1, 1724330034.1225646]
VI_at__the_End : ['1.201', '0.4704', '1.800', '0.1303', '1.805', '0.1157', '7.000', '0.7086', 1, 1, 1, 1, 1724330090.7863762]