TEST_NAME : Wafer
TEST_DATE : 24_08_22-15_27_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-012-010-00 | FUSED_ID : 6359364768384467104
  IC_TEMP :  -64.95 | VDDM : 1122.15 | AUX_INT :  -10.25 | CsaBias :   67.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70845e-03 / 2
  ADC_P0  : -1.02515e-02 ± 2.79953e-02
  ADC_P1  : 8.72962e-03 ± 6.97916e-04
  ADC_P2  : -6.98110e-06 ± 3.45683e-06
  CSA_Chi2/NDF : 1.51916e-04 / 2
  CSA_P0  : 6.03692e-02 ± 8.22098e-03
  CSA_P1  : 1.00783e-02 ± 6.19392e-04
  CSA_P2  : -5.42554e-05 ± 9.43261e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [4, 12, 14, 18, 31, 41, 42, 56, 57, 68, 80, 100, 106, 116, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [5, 15, 25, 31, 41, 42, 47, 48, 57, 65, 73, 93, 105, 106, 110, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1991', '1.800', '0.1450', '1.800', '0.0848', '7.000', '0.7079', 1, 1, 1, 1, 1724333274.5857964]
VI_after__Init : ['1.201', '0.1992', '1.800', '0.1449', '1.800', '0.0792', '7.000', '0.7081', 1, 1, 1, 1, 1724333282.7642298]
VI_at__the_End : ['1.201', '0.4769', '1.800', '0.1367', '1.801', '0.1147', '7.000', '0.7087', 1, 1, 1, 1, 1724333350.1893477]