TEST_NAME : Wafer
TEST_DATE : 24_08_22-15_34_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-012-014-00 | FUSED_ID : 6359364768384467168
  IC_TEMP :  -56.77 | VDDM : 1128.82 | AUX_INT :   -8.12 | CsaBias :   76.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08484e-03 / 2
  ADC_P0  : -8.11991e-03 ± 2.22982e-02
  ADC_P1  : 8.50749e-03 ± 5.56854e-04
  ADC_P2  : -5.88597e-06 ± 2.76104e-06
  CSA_Chi2/NDF : 1.27884e-04 / 2
  CSA_P0  : 6.41172e-02 ± 7.54276e-03
  CSA_P1  : 1.01652e-02 ± 5.68293e-04
  CSA_P2  : -5.13763e-05 ± 8.65442e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [0, 49, 73, 75, 79, 83, 88, 89, 96, 102, 103, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [9, 23, 24, 27, 32, 34, 38, 42, 47, 48, 53, 75, 78, 81, 91, 118, 125, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4338', '1.800', '0.1647', '1.799', '0.0934', '7.000', '0.7080', 1, 1, 1, 1, 1724333655.8369517]
VI_after__Init : ['1.201', '0.4341', '1.800', '0.1647', '1.801', '0.0880', '7.000', '0.7082', 1, 1, 1, 1, 1724333663.8333597]
VI_at__the_End : ['1.201', '0.4945', '1.800', '0.1415', '1.804', '0.1123', '7.000', '0.7087', 1, 1, 1, 1, 1724333733.185153]