TEST_NAME : Wafer
TEST_DATE : 24_08_22-15_42_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-012-019-07 | FUSED_ID : 6359364768384467255
  IC_TEMP :  -58.28 | VDDM : 1121.80 | AUX_INT :   -9.95 | CsaBias :   66.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62233e-03 / 2
  ADC_P0  : -9.95162e-03 ± 2.73003e-02
  ADC_P1  : 8.51668e-03 ± 6.72357e-04
  ADC_P2  : -6.18127e-06 ± 3.29702e-06
  CSA_Chi2/NDF : 1.33380e-04 / 2
  CSA_P0  : 5.94110e-02 ± 7.70313e-03
  CSA_P1  : 1.01709e-02 ± 5.80375e-04
  CSA_P2  : -5.42208e-05 ± 8.83843e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [12, 23, 33, 41, 55, 60, 73, 82, 98, 105, 109]
 | N_BROKEN_SLOW :  [23, 25, 36, 46, 63, 90, 119, 126]
   P_BROKEN_DISC :  34
 | P_BROKEN_FAST :  [30, 58, 59, 69, 80, 82, 97, 114, 118, 119, 121]
 | P_BROKEN_SLOW :  [0, 1, 3, 8, 10, 13, 16, 22, 26, 28, 29, 32, 34, 37, 41, 45, 46, 50, 52, 57, 63, 90, 93]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2446', '1.800', '0.1649', '1.799', '0.0911', '7.000', '0.7075', 1, 1, 1, 1, 1724334134.5709844]
VI_after__Init : ['1.202', '0.2437', '1.800', '0.1643', '1.801', '0.0860', '7.000', '0.7076', 1, 1, 1, 1, 1724334143.4781911]
VI_at__the_End : ['1.202', '0.4810', '1.800', '0.1392', '1.799', '0.1142', '7.000', '0.7084', 1, 1, 1, 1, 1724334205.756554]