TEST_NAME : Wafer
TEST_DATE : 24_08_22-15_43_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-012-020-07 | FUSED_ID : 6359364768384467271
  IC_TEMP :  -66.14 | VDDM : 1116.46 | AUX_INT :   -8.93 | CsaBias :   84.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53432e-03 / 2
  ADC_P0  : -8.93178e-03 ± 2.66073e-02
  ADC_P1  : 7.84276e-03 ± 6.19621e-04
  ADC_P2  : -4.55712e-06 ± 2.87244e-06
  CSA_Chi2/NDF : 1.62429e-04 / 2
  CSA_P0  : 5.72904e-02 ± 8.50069e-03
  CSA_P1  : 1.00936e-02 ± 6.40465e-04
  CSA_P2  : -5.63398e-05 ± 9.75353e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [9, 17, 21, 24, 33, 40, 47, 50, 68, 72, 80, 86, 92, 105, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [4, 39, 47, 64, 66, 81, 93, 96, 103, 110, 113, 114, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3319', '1.800', '0.1315', '1.800', '0.0960', '7.000', '0.7074', 1, 1, 1, 1, 1724334230.6525567]
VI_after__Init : ['1.201', '0.3316', '1.800', '0.1316', '1.799', '0.0909', '7.000', '0.7076', 1, 1, 1, 1, 1724334238.7259517]
VI_at__the_End : ['1.201', '0.4632', '1.800', '0.1347', '1.803', '0.1154', '7.000', '0.7081', 1, 1, 1, 1, 1724334306.0908542]