TEST_NAME : Wafer
TEST_DATE : 24_08_22-15_50_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-012-024-07 | FUSED_ID : 6359364768384467335
  IC_TEMP :  -58.54 | VDDM : 1118.83 | AUX_INT :   -8.91 | CsaBias :   70.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25214e-03 / 2
  ADC_P0  : -8.90933e-03 ± 2.39598e-02
  ADC_P1  : 7.96609e-03 ± 5.56650e-04
  ADC_P2  : -5.24375e-06 ± 2.57285e-06
  CSA_Chi2/NDF : 1.19509e-04 / 2
  CSA_P0  : 5.91722e-02 ± 7.29160e-03
  CSA_P1  : 9.72076e-03 ± 5.49370e-04
  CSA_P2  : -4.69697e-05 ± 8.36625e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [29, 31, 43, 46, 78, 79, 111, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [5, 13, 39, 40, 41, 80, 84, 110, 119, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1677', '1.800', '0.1327', '1.800', '0.0865', '7.000', '0.7071', 1, 1, 1, 1, 1724334612.9715276]
VI_after__Init : ['1.202', '0.1677', '1.800', '0.1327', '1.800', '0.0810', '7.000', '0.7072', 1, 1, 1, 1, 1724334621.2138965]
VI_at__the_End : ['1.202', '0.4804', '1.800', '0.1330', '1.802', '0.1136', '7.000', '0.7079', 1, 1, 1, 1, 1724334680.6040213]