TEST_NAME : Wafer
TEST_DATE : 24_08_22-15_53_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-012-026-07 | FUSED_ID : 6359364768384467367
  IC_TEMP :  -61.70 | VDDM : 1121.31 | AUX_INT :   -7.95 | CsaBias :   67.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.53691e-04 / 2
  ADC_P0  : -7.95068e-03 ± 2.08747e-02
  ADC_P1  : 8.48135e-03 ± 5.16651e-04
  ADC_P2  : -6.05636e-06 ± 2.53762e-06
  CSA_Chi2/NDF : 1.78333e-04 / 2
  CSA_P0  : 5.99520e-02 ± 8.90714e-03
  CSA_P1  : 1.01428e-02 ± 6.71089e-04
  CSA_P2  : -5.17894e-05 ± 1.02199e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [1, 10, 20, 23, 36, 37, 45, 60, 62, 65, 72, 78, 80, 85, 95, 122, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [11, 34, 45, 46, 61, 75, 94, 102, 114, 115, 118, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2454', '1.800', '0.1008', '1.799', '0.0807', '7.000', '0.7073', 1, 1, 1, 1, 1724334803.5675852]
VI_after__Init : ['1.201', '0.2454', '1.799', '0.1008', '1.800', '0.0752', '7.000', '0.7073', 1, 1, 1, 1, 1724334811.8048933]
VI_at__the_End : ['1.201', '0.4891', '1.800', '0.1350', '1.804', '0.1130', '7.000', '0.7081', 1, 1, 1, 1, 1724334879.000294]