TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_30_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-013-005-13 | FUSED_ID : 6359364768384471133
  IC_TEMP :  -55.76 | VDDM : 1127.71 | AUX_INT :   -6.67 | CsaBias :   61.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02515e-03 / 2
  ADC_P0  : -6.66651e-03 ± 2.17107e-02
  ADC_P1  : 8.57666e-03 ± 5.58142e-04
  ADC_P2  : -5.52705e-06 ± 2.83627e-06
  CSA_Chi2/NDF : 1.34387e-04 / 2
  CSA_P0  : 5.85406e-02 ± 7.73217e-03
  CSA_P1  : 9.61858e-03 ± 5.82563e-04
  CSA_P2  : -4.56319e-05 ± 8.87175e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  21
 | N_BROKEN_FAST :  [2, 14, 17, 21, 24, 25, 36, 37, 58, 65, 68, 76, 84, 87, 89, 91, 94, 95, 108, 114, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [7, 26, 39, 44, 63, 80, 81, 86, 87, 117, 118, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3126', '1.800', '0.1339', '1.799', '0.0892', '7.000', '0.7074', 1, 1, 1, 1, 1724337004.0844712]
VI_after__Init : ['1.201', '0.3127', '1.800', '0.1339', '1.800', '0.0838', '7.000', '0.7075', 1, 1, 1, 1, 1724337012.2038422]
VI_at__the_End : ['1.201', '0.4793', '1.800', '0.1383', '1.807', '0.1132', '7.000', '0.7081', 1, 1, 1, 1, 1724337080.1347175]