TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_28_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-013-006-13 | FUSED_ID : 6359364768384471149
  IC_TEMP :  -57.77 | VDDM : 1127.97 | AUX_INT :   -9.60 | CsaBias :   67.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75507e-03 / 2
  ADC_P0  : -9.59944e-03 ± 2.84796e-02
  ADC_P1  : 8.63486e-03 ± 7.29289e-04
  ADC_P2  : -5.44499e-06 ± 3.72559e-06
  CSA_Chi2/NDF : 1.85234e-04 / 2
  CSA_P0  : 6.14626e-02 ± 9.07785e-03
  CSA_P1  : 1.03935e-02 ± 6.83951e-04
  CSA_P2  : -5.51144e-05 ± 1.04158e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [14, 18, 19, 34, 36, 46, 49, 66, 97, 102, 104, 114, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [39, 48, 54, 55, 75, 80, 83, 85, 92, 93, 95, 104, 112, 114, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2848', '1.800', '0.1325', '1.800', '0.0902', '7.000', '0.7073', 1, 1, 1, 1, 1724336908.0286188]
VI_after__Init : ['1.201', '0.2849', '1.800', '0.1325', '1.800', '0.0845', '7.000', '0.7074', 1, 1, 1, 1, 1724336916.2069721]
VI_at__the_End : ['1.201', '0.4927', '1.800', '0.1422', '1.802', '0.1136', '7.000', '0.7081', 1, 1, 1, 1, 1724336983.2119358]