TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_26_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-013-007-13 | FUSED_ID : 6359364768384471165
  IC_TEMP :  -56.08 | VDDM : 1122.71 | AUX_INT :   -8.16 | CsaBias :   66.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16880e-03 / 2
  ADC_P0  : -8.15642e-03 ± 2.31968e-02
  ADC_P1  : 8.32672e-03 ± 5.77504e-04
  ADC_P2  : -4.94657e-06 ± 2.86169e-06
  CSA_Chi2/NDF : 1.18861e-04 / 2
  CSA_P0  : 6.05545e-02 ± 7.27179e-03
  CSA_P1  : 1.01941e-02 ± 5.47877e-04
  CSA_P2  : -5.29378e-05 ± 8.34351e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [5, 8, 12, 17, 22, 37, 49, 58, 59, 75, 80, 83, 99, 105, 109, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [0, 2, 5, 15, 16, 17, 19, 26, 27, 30, 34, 39, 56, 66, 82, 87, 101, 106, 113, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3450', '1.800', '0.1409', '1.799', '0.0881', '7.000', '0.7076', 1, 1, 1, 1, 1724336812.1875427]
VI_after__Init : ['1.201', '0.3449', '1.800', '0.1410', '1.801', '0.0828', '7.000', '0.7073', 1, 1, 1, 1, 1724336820.3010297]
VI_at__the_End : ['1.201', '0.4881', '1.800', '0.1384', '1.800', '0.1120', '7.000', '0.7085', 1, 1, 1, 1, 1724336884.2733283]