TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_25_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-013-008-13 | FUSED_ID : 6359364768384471181
  IC_TEMP :  -60.72 | VDDM : 1126.64 | AUX_INT :   -9.34 | CsaBias :   56.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54387e-03 / 2
  ADC_P0  : -9.33600e-03 ± 2.66342e-02
  ADC_P1  : 8.33228e-03 ± 6.44061e-04
  ADC_P2  : -5.93212e-06 ± 3.09261e-06
  CSA_Chi2/NDF : 1.50196e-04 / 2
  CSA_P0  : 6.10234e-02 ± 8.17431e-03
  CSA_P1  : 1.04235e-02 ± 6.15875e-04
  CSA_P2  : -5.58524e-05 ± 9.37905e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 19, 25, 27, 35, 47, 50, 63, 66, 89, 113, 114, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [10, 20, 21, 28, 29, 33, 40, 43, 46, 47, 62, 68, 75, 79, 94, 97, 100, 115, 116, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3071', '1.774', '0.2497', '0.947', '0.1499', '7.000', '0.7076', 1, 1, 1, 1, 1724336715.834591]
VI_after__Init : ['1.201', '0.3099', '1.800', '0.1494', '1.801', '0.0864', '7.000', '0.7076', 1, 1, 1, 1, 1724336724.58001]
VI_at__the_End : ['1.201', '0.4945', '1.800', '0.1409', '1.801', '0.1127', '7.000', '0.7082', 1, 1, 1, 1, 1724336791.2291515]