TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_14_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-013-015-13 | FUSED_ID : 6359364768384471293
  IC_TEMP :  -59.04 | VDDM : 1116.99 | AUX_INT :   -8.52 | CsaBias :   74.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25737e-03 / 2
  ADC_P0  : -8.52239e-03 ± 2.40341e-02
  ADC_P1  : 8.38787e-03 ± 5.93101e-04
  ADC_P2  : -5.59777e-06 ± 2.90857e-06
  CSA_Chi2/NDF : 1.51745e-04 / 2
  CSA_P0  : 5.97728e-02 ± 8.21635e-03
  CSA_P1  : 1.02552e-02 ± 6.19043e-04
  CSA_P2  : -5.47512e-05 ± 9.42729e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [4, 6, 11, 13, 14, 30, 41, 51, 72, 83, 89, 95, 102, 112, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 10, 16, 17, 42, 47, 50, 58, 65, 75, 91, 95, 97, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1533', '1.800', '0.1568', '1.799', '0.0857', '7.000', '0.7075', 1, 1, 1, 1, 1724336046.6588702]
VI_after__Init : ['1.201', '0.1534', '1.800', '0.1568', '1.802', '0.0803', '7.000', '0.7078', 1, 1, 1, 1, 1724336055.4861217]
VI_at__the_End : ['1.201', '0.4854', '1.800', '0.1391', '1.804', '0.1144', '7.000', '0.7084', 1, 1, 1, 1, 1724336122.8008845]