TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_12_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-013-016-10 | FUSED_ID : 6359364768384471306
  IC_TEMP :  -53.60 | VDDM : 1128.70 | AUX_INT :  -60.51 | CsaBias :   41.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43046e-03 / 2
  ADC_P0  : -6.05134e-02 ± 2.84731e-02
  ADC_P1  : 8.59716e-03 ± 6.52674e-04
  ADC_P2  : -7.03033e-06 ± 2.95512e-06
  CSA_Chi2/NDF : 1.09133e-04 / 2
  CSA_P0  : 5.83096e-02 ± 6.96788e-03
  CSA_P1  : 9.81171e-03 ± 5.24979e-04
  CSA_P2  : -4.67775e-05 ± 7.99481e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [1, 12, 17, 19, 43, 44, 46, 47, 49, 53, 56, 83, 95, 108, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [3, 12, 15, 19, 27, 31, 44, 61, 80, 84, 91, 94, 107, 114, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1055', '1.800', '0.1363', '1.799', '0.0843', '7.000', '0.7083', 1, 1, 1, 1, 1724335950.7703428]
VI_after__Init : ['1.202', '0.1055', '1.800', '0.1363', '1.800', '0.0768', '7.000', '0.7078', 1, 1, 1, 1, 1724335958.8066401]
VI_at__the_End : ['1.201', '0.4871', '1.800', '0.1354', '1.801', '0.1125', '7.000', '0.7084', 1, 1, 1, 1, 1724336020.159901]