TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_10_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-013-017-10 | FUSED_ID : 6359364768384471322
  IC_TEMP :  -52.85 | VDDM : 1122.00 | AUX_INT :   -8.24 | CsaBias :   82.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06913e-03 / 2
  ADC_P0  : -8.24055e-03 ± 2.21287e-02
  ADC_P1  : 8.35237e-03 ± 5.41267e-04
  ADC_P2  : -5.74395e-06 ± 2.62969e-06
  CSA_Chi2/NDF : 1.47417e-04 / 2
  CSA_P0  : 5.89484e-02 ± 8.09833e-03
  CSA_P1  : 1.02068e-02 ± 6.10151e-04
  CSA_P2  : -5.14528e-05 ± 9.29188e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [29, 32, 33, 37, 67, 71, 78, 81, 85, 89, 95, 102, 105, 107, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [6, 9, 38, 47, 54, 65, 82, 89, 101, 108, 116, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2568', '1.800', '0.1401', '1.799', '0.0900', '7.000', '0.7077', 1, 1, 1, 1, 1724335855.0929377]
VI_after__Init : ['1.201', '0.2568', '1.800', '0.1400', '1.800', '0.0842', '7.000', '0.7077', 1, 1, 1, 1, 1724335863.8781793]
VI_at__the_End : ['1.201', '0.4917', '1.800', '0.1386', '1.804', '0.1114', '7.000', '0.7085', 1, 1, 1, 1, 1724335922.8405092]