TEST_NAME : Wafer
TEST_DATE : 24_08_22-15_59_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-013-024-10 | FUSED_ID : 6359364768384471434
  IC_TEMP :  -53.32 | VDDM : 1117.42 | AUX_INT :  -10.40 | CsaBias :   71.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80619e-03 / 2
  ADC_P0  : -1.03987e-02 ± 2.88278e-02
  ADC_P1  : 8.25049e-03 ± 6.87653e-04
  ADC_P2  : -5.74610e-06 ± 3.26979e-06
  CSA_Chi2/NDF : 1.11561e-04 / 2
  CSA_P0  : 5.85591e-02 ± 7.04495e-03
  CSA_P1  : 9.54215e-03 ± 5.30786e-04
  CSA_P2  : -4.25523e-05 ± 8.08325e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [42, 53, 64, 83, 90, 94, 103, 108, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [1, 11, 20, 29, 31, 33, 34, 36, 46, 49, 64, 85, 89, 98, 112, 124, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3656', '1.800', '0.1553', '1.799', '0.0891', '7.000', '0.7077', 1, 1, 1, 1, 1724335184.5542057]
VI_after__Init : ['1.201', '0.3658', '1.800', '0.1554', '1.799', '0.0841', '7.000', '0.7077', 1, 1, 1, 1, 1724335192.7935529]
VI_at__the_End : ['1.201', '0.4871', '1.800', '0.1377', '1.799', '0.1121', '7.000', '0.7083', 1, 1, 1, 1, 1724335260.8079925]