TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_42_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-014-008-03 | FUSED_ID : 6359364768384475267
  IC_TEMP :  -56.48 | VDDM : 1128.47 | AUX_INT :   -8.66 | CsaBias :   73.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61713e-03 / 2
  ADC_P0  : -8.65763e-03 ± 2.73476e-02
  ADC_P1  : 8.25568e-03 ± 6.76483e-04
  ADC_P2  : -4.80145e-06 ± 3.32769e-06
  CSA_Chi2/NDF : 1.52272e-04 / 2
  CSA_P0  : 6.09909e-02 ± 8.23061e-03
  CSA_P1  : 1.00005e-02 ± 6.20117e-04
  CSA_P2  : -5.00101e-05 ± 9.44365e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [10, 20, 22, 51, 59, 63, 69, 77, 83, 84, 89, 92, 105, 107, 116, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [18, 20, 22, 29, 42, 44, 55, 59, 66, 78, 81, 84, 93, 106, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3739', '1.800', '0.1596', '1.800', '0.0954', '7.000', '0.7077', 1, 1, 1, 1, 1724337769.2194252]
VI_after__Init : ['1.202', '0.3743', '1.800', '0.1596', '1.799', '0.0896', '7.000', '0.7075', 1, 1, 1, 1, 1724337777.3688178]
VI_at__the_End : ['1.202', '0.4862', '1.800', '0.1383', '1.800', '0.1121', '7.000', '0.7083', 1, 1, 1, 1, 1724337837.903145]