TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_44_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-014-009-03 | FUSED_ID : 6359364768384475283
  IC_TEMP :  -53.83 | VDDM : 1118.58 | AUX_INT :   -9.40 | CsaBias :   78.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54667e-03 / 2
  ADC_P0  : -9.39580e-03 ± 2.67129e-02
  ADC_P1  : 8.01575e-03 ± 6.33183e-04
  ADC_P2  : -4.76439e-06 ± 2.99560e-06
  CSA_Chi2/NDF : 1.37236e-04 / 2
  CSA_P0  : 5.81177e-02 ± 7.81369e-03
  CSA_P1  : 9.82941e-03 ± 5.88705e-04
  CSA_P2  : -4.76055e-05 ± 8.96529e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [6, 17, 19, 48, 67, 73, 83, 88, 91, 102, 106, 107, 119, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [18, 31, 37, 38, 41, 46, 63, 64, 87, 89, 101, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3162', '1.800', '0.1403', '1.799', '0.0854', '7.000', '0.7076', 1, 1, 1, 1, 1724337864.9761052]
VI_after__Init : ['1.202', '0.3163', '1.800', '0.1403', '1.800', '0.0798', '7.000', '0.7077', 1, 1, 1, 1, 1724337873.184477]
VI_at__the_End : ['1.202', '0.4854', '1.800', '0.1356', '1.802', '0.1108', '7.000', '0.7085', 1, 1, 1, 1, 1724337933.7868145]