TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_47_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-014-011-03 | FUSED_ID : 6359364768384475315
  IC_TEMP :  -54.97 | VDDM : 1133.45 | AUX_INT :   -6.21 | CsaBias :   75.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.61863e-04 / 2
  ADC_P0  : -6.20701e-03 ± 2.10239e-02
  ADC_P1  : 8.25724e-03 ± 5.19226e-04
  ADC_P2  : -5.28423e-06 ± 2.52941e-06
  CSA_Chi2/NDF : 1.05159e-04 / 2
  CSA_P0  : 5.82018e-02 ± 6.83983e-03
  CSA_P1  : 9.75953e-03 ± 5.15332e-04
  CSA_P2  : -4.66932e-05 ± 7.84789e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [0, 5, 7, 9, 16, 19, 45, 55, 70, 71, 78, 97, 99, 104, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [4, 18, 33, 51, 75, 83, 84, 117, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4556', '1.800', '0.1433', '1.800', '0.0971', '7.000', '0.7077', 1, 1, 1, 1, 1724338056.5152473]
VI_after__Init : ['1.201', '0.4560', '1.800', '0.1434', '1.801', '0.0913', '7.000', '0.7076', 1, 1, 1, 1, 1724338065.3595765]
VI_at__the_End : ['1.202', '0.4842', '1.800', '0.1370', '1.804', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1724338132.7045827]