TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_57_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-014-017-04 | FUSED_ID : 6359364768384475412
  IC_TEMP :  -54.44 | VDDM : 1121.97 | AUX_INT :   -7.95 | CsaBias :   73.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21165e-03 / 2
  ADC_P0  : -7.95408e-03 ± 2.35952e-02
  ADC_P1  : 8.20986e-03 ± 5.71662e-04
  ADC_P2  : -5.39031e-06 ± 2.74503e-06
  CSA_Chi2/NDF : 8.31436e-05 / 2
  CSA_P0  : 6.03333e-02 ± 6.08186e-03
  CSA_P1  : 9.33700e-03 ± 4.58224e-04
  CSA_P2  : -4.04010e-05 ± 6.97822e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [26, 59, 61, 66, 81, 83, 84, 88, 89, 94, 104, 110, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [37, 58, 72, 73, 93, 111, 117, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1332', '1.800', '0.1488', '1.800', '0.0837', '7.000', '0.7085', 1, 1, 1, 1, 1724338624.567619]
VI_after__Init : ['1.202', '0.1332', '1.800', '0.1489', '1.799', '0.0763', '7.000', '0.7077', 1, 1, 1, 1, 1724338632.7829814]
VI_at__the_End : ['1.199', '0.4841', '1.800', '0.1370', '1.807', '0.1116', '7.000', '0.7086', 1, 1, 1, 1, 1724338696.661081]