TEST_NAME : Wafer
TEST_DATE : 24_08_22-16_58_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-014-018-04 | FUSED_ID : 6359364768384475428
  IC_TEMP :  -57.57 | VDDM : 1123.64 | AUX_INT :   -9.56 | CsaBias :   73.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73237e-03 / 2
  ADC_P0  : -9.55816e-03 ± 2.81714e-02
  ADC_P1  : 8.40789e-03 ± 6.74055e-04
  ADC_P2  : -6.54494e-06 ± 3.20679e-06
  CSA_Chi2/NDF : 1.37563e-04 / 2
  CSA_P0  : 6.08359e-02 ± 7.82299e-03
  CSA_P1  : 9.98908e-03 ± 5.89406e-04
  CSA_P2  : -4.93107e-05 ± 8.97596e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [0, 2, 8, 15, 21, 22, 27, 33, 40, 42, 65, 66, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [0, 3, 11, 16, 17, 20, 27, 29, 45, 63, 65, 78, 91, 95, 103, 105, 111, 116, 119, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1834', '1.800', '0.1473', '1.799', '0.0935', '7.000', '0.7076', 1, 1, 1, 1, 1724338719.645324]
VI_after__Init : ['1.202', '0.1835', '1.800', '0.1473', '1.801', '0.0878', '7.000', '0.7078', 1, 1, 1, 1, 1724338728.4186354]
VI_at__the_End : ['1.202', '0.4903', '1.800', '0.1387', '1.805', '0.1146', '7.000', '0.7084', 1, 1, 1, 1, 1724338794.7956326]