TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_08_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-014-024-04 | FUSED_ID : 6359364768384475524
  IC_TEMP :  -59.94 | VDDM : 1121.03 | AUX_INT :   -6.40 | CsaBias :   91.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.56690e-04 / 2
  ADC_P0  : -6.40135e-03 ± 1.98534e-02
  ADC_P1  : 8.22182e-03 ± 4.93624e-04
  ADC_P2  : -4.70416e-06 ± 2.43206e-06
  CSA_Chi2/NDF : 1.62466e-04 / 2
  CSA_P0  : 5.98497e-02 ± 8.50164e-03
  CSA_P1  : 9.75716e-03 ± 6.40538e-04
  CSA_P2  : -4.80122e-05 ± 9.75463e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 19, 25, 37, 43, 47, 52, 66, 101, 105, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 14, 44, 45, 54, 62, 71, 72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3034', '1.800', '0.1283', '1.800', '0.0963', '7.000', '0.7078', 1, 1, 1, 1, 1724339293.5602007]
VI_after__Init : ['1.202', '0.3030', '1.800', '0.1283', '1.800', '0.0908', '7.000', '0.7079', 1, 1, 1, 1, 1724339301.7035558]
VI_at__the_End : ['1.202', '0.4806', '1.800', '0.1361', '1.804', '0.1121', '7.000', '0.7086', 1, 1, 1, 1, 1724339366.2206504]