TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_46_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-015-004-14 | FUSED_ID : 6359364768384479310
  IC_TEMP :  -60.92 | VDDM : 1116.90 | AUX_INT :  -10.31 | CsaBias :   60.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.95887e-03 / 2
  ADC_P0  : -1.03100e-02 ± 3.00348e-02
  ADC_P1  : 8.94665e-03 ± 7.71896e-04
  ADC_P2  : -7.10256e-06 ± 3.94173e-06
  CSA_Chi2/NDF : 1.78356e-04 / 2
  CSA_P0  : 5.70818e-02 ± 8.90772e-03
  CSA_P1  : 9.77453e-03 ± 6.71133e-04
  CSA_P2  : -4.95776e-05 ± 1.02206e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [1, 12, 27, 30, 37, 49, 58, 66, 73, 92, 95, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [1, 10, 21, 27, 43, 64, 65, 66, 67, 91, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0779', '1.800', '0.1189', '1.800', '0.0856', '7.000', '0.7074', 1, 1, 1, 1, 1724341586.2665286]
VI_after__Init : ['1.202', '0.0779', '1.800', '0.1189', '1.801', '0.0798', '7.000', '0.7074', 1, 1, 1, 1, 1724341595.0049722]
VI_at__the_End : ['1.202', '0.4735', '1.800', '0.1338', '1.804', '0.1135', '7.000', '0.7081', 1, 1, 1, 1, 1724341661.7620158]