TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_40_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-015-008-14 | FUSED_ID : 6359364768384479374
  IC_TEMP :  -57.11 | VDDM : 1121.45 | AUX_INT :  -64.54 | CsaBias :   17.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80459e-03 / 2
  ADC_P0  : -6.45445e-02 ± 3.22819e-02
  ADC_P1  : 9.20510e-03 ± 7.87816e-04
  ADC_P2  : -8.05167e-06 ± 3.79721e-06
  CSA_Chi2/NDF : 2.10301e-04 / 2
  CSA_P0  : 5.90941e-02 ± 9.67260e-03
  CSA_P1  : 1.03360e-02 ± 7.28760e-04
  CSA_P2  : -5.81891e-05 ± 1.10982e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [8, 14, 15, 23, 29, 35, 36, 40, 57, 66, 70, 72, 82, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [6, 13, 14, 20, 31, 34, 37, 63, 73, 78, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4453', '1.800', '0.1170', '1.799', '0.0936', '7.000', '0.7078', 1, 1, 1, 1, 1724341204.357245]
VI_after__Init : ['1.202', '0.4396', '1.800', '0.1172', '1.800', '0.0874', '7.000', '0.7078', 1, 1, 1, 1, 1724341212.363686]
VI_at__the_End : ['1.202', '0.4771', '1.800', '0.1377', '1.809', '0.1126', '7.000', '0.7083', 1, 1, 1, 1, 1724341280.4390683]