TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_30_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-015-014-14 | FUSED_ID : 6359364768384479470
  IC_TEMP :  -53.77 | VDDM : 1123.96 | AUX_INT :   -9.35 | CsaBias :   73.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63608e-03 / 2
  ADC_P0  : -9.35154e-03 ± 2.74954e-02
  ADC_P1  : 8.28771e-03 ± 6.78735e-04
  ADC_P2  : -4.88212e-06 ± 3.34216e-06
  CSA_Chi2/NDF : 1.55722e-04 / 2
  CSA_P0  : 6.09177e-02 ± 8.32334e-03
  CSA_P1  : 1.02342e-02 ± 6.27104e-04
  CSA_P2  : -5.24461e-05 ± 9.55005e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [39, 41, 47, 63, 73, 75, 82, 87, 89, 101, 105, 112, 114, 115, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [11, 15, 18, 38, 39, 46, 53, 64, 73, 87, 101, 106, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2072', '1.800', '0.1201', '1.800', '0.0896', '7.000', '0.7077', 1, 1, 1, 1, 1724340632.2778387]
VI_after__Init : ['1.202', '0.2072', '1.800', '0.1201', '1.800', '0.0839', '7.000', '0.7077', 1, 1, 1, 1, 1724340641.0021913]
VI_at__the_End : ['1.202', '0.4948', '1.800', '0.1398', '1.799', '0.1114', '7.000', '0.7083', 1, 1, 1, 1, 1724340707.9549131]