TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_27_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-015-016-09 | FUSED_ID : 6359364768384479497
  IC_TEMP :  -53.99 | VDDM : 1122.37 | AUX_INT :   -9.95 | CsaBias :   64.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72462e-03 / 2
  ADC_P0  : -9.94979e-03 ± 2.82088e-02
  ADC_P1  : 8.33802e-03 ± 6.92583e-04
  ADC_P2  : -5.26129e-06 ± 3.39433e-06
  CSA_Chi2/NDF : 1.59080e-04 / 2
  CSA_P0  : 5.97939e-02 ± 8.41259e-03
  CSA_P1  : 1.03035e-02 ± 6.33828e-04
  CSA_P2  : -5.42327e-05 ± 9.65245e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [6, 18, 26, 36, 40, 45, 53, 66, 68, 71, 74, 99, 107, 112, 120, 124, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [13, 17, 36, 61, 71, 77, 79, 83, 105, 106, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1512', '1.800', '0.1773', '1.799', '0.0841', '7.000', '0.7073', 1, 1, 1, 1, 1724340441.123384]
VI_after__Init : ['1.202', '0.1513', '1.800', '0.1773', '1.800', '0.0782', '7.000', '0.7072', 1, 1, 1, 1, 1724340449.248822]
VI_at__the_End : ['1.202', '0.4892', '1.800', '0.1358', '1.804', '0.1128', '7.000', '0.7080', 1, 1, 1, 1, 1724340509.1191328]