TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_25_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-015-017-09 | FUSED_ID : 6359364768384479513
  IC_TEMP :  -49.59 | VDDM : 1125.83 | AUX_INT :  -26.09 | CsaBias :   62.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70132e-03 / 2
  ADC_P0  : -2.60854e-02 ± 2.89717e-02
  ADC_P1  : 8.08593e-03 ± 6.69787e-04
  ADC_P2  : -5.29043e-06 ± 3.08175e-06
  CSA_Chi2/NDF : 1.20616e-04 / 2
  CSA_P0  : 5.97334e-02 ± 7.32529e-03
  CSA_P1  : 9.94629e-03 ± 5.51908e-04
  CSA_P2  : -4.83949e-05 ± 8.40490e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [3, 12, 13, 27, 32, 59, 75, 90, 93, 112, 118, 124, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [7, 11, 14, 18, 38, 41, 62, 74, 75, 83, 111, 114, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2421', '1.800', '0.1140', '1.799', '0.0880', '7.000', '0.7070', 1, 1, 1, 1, 1724340345.1848328]
VI_after__Init : ['1.202', '0.2424', '1.800', '0.1140', '1.800', '0.0826', '7.000', '0.7069', 1, 1, 1, 1, 1724340353.3231952]
VI_at__the_End : ['1.201', '0.4904', '1.800', '0.1335', '1.804', '0.1101', '7.000', '0.7081', 1, 1, 1, 1, 1724340413.240572]