TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_17_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-015-022-09 | FUSED_ID : 6359364768384479593
  IC_TEMP :  -55.01 | VDDM : 1125.90 | AUX_INT :   -9.20 | CsaBias :   73.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35453e-03 / 2
  ADC_P0  : -9.19524e-03 ± 2.49105e-02
  ADC_P1  : 8.30670e-03 ± 5.97162e-04
  ADC_P2  : -6.07760e-06 ± 2.84128e-06
  CSA_Chi2/NDF : 1.12234e-04 / 2
  CSA_P0  : 6.16338e-02 ± 7.06619e-03
  CSA_P1  : 9.55798e-03 ± 5.32386e-04
  CSA_P2  : -4.23921e-05 ± 8.10761e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 10, 13, 22, 34, 36, 54, 57, 60, 66, 69, 89, 90, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [37, 54, 70, 84, 101, 105, 113, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2519', '1.800', '0.1252', '1.799', '0.0845', '7.000', '0.7088', 1, 1, 1, 1, 1724339867.015376]
VI_after__Init : ['1.201', '0.2519', '1.800', '0.1251', '1.801', '0.0772', '7.000', '0.7076', 1, 1, 1, 1, 1724339875.0558517]
VI_at__the_End : ['1.202', '0.4913', '1.800', '0.1373', '1.808', '0.1106', '7.000', '0.7089', 1, 1, 1, 1, 1724339935.5191014]