TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_16_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-015-023-09 | FUSED_ID : 6359364768384479609
  IC_TEMP :  -54.56 | VDDM : 1124.70 | AUX_INT :   -8.58 | CsaBias :   72.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48861e-03 / 2
  ADC_P0  : -8.57920e-03 ± 2.61519e-02
  ADC_P1  : 8.17060e-03 ± 6.21732e-04
  ADC_P2  : -5.54287e-06 ± 2.94301e-06
  CSA_Chi2/NDF : 1.42926e-04 / 2
  CSA_P0  : 5.93064e-02 ± 7.97404e-03
  CSA_P1  : 1.00229e-02 ± 6.00786e-04
  CSA_P2  : -4.85332e-05 ± 9.14927e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [5, 7, 10, 61, 68, 69, 71, 83, 84, 103, 105, 109, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [14, 46, 65, 70, 75, 80, 101, 102, 104, 105, 106, 111, 112, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1254', '1.800', '0.1655', '1.800', '0.0841', '7.000', '0.7082', 1, 1, 1, 1, 1724339771.223778]
VI_after__Init : ['1.202', '0.1254', '1.800', '0.1653', '1.799', '0.0783', '7.000', '0.7078', 1, 1, 1, 1, 1724339779.9470334]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1359', '1.800', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1724339840.7743893]