TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_14_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-015-024-09 | FUSED_ID : 6359364768384479625
  IC_TEMP :  -53.55 | VDDM : 1121.20 | AUX_INT :   -7.66 | CsaBias :   78.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17143e-03 / 2
  ADC_P0  : -7.66311e-03 ± 2.31943e-02
  ADC_P1  : 7.91026e-03 ± 5.41089e-04
  ADC_P2  : -5.09751e-06 ± 2.49653e-06
  CSA_Chi2/NDF : 8.01568e-05 / 2
  CSA_P0  : 5.74527e-02 ± 5.97162e-03
  CSA_P1  : 9.29827e-03 ± 4.49919e-04
  CSA_P2  : -3.92278e-05 ± 6.85173e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [9, 22, 25, 29, 32, 33, 34, 47, 59, 68, 69, 85, 87, 120, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [15, 16, 18, 21, 25, 29, 41, 42, 47, 58, 60, 62, 75, 82, 83, 103, 115, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1950', '1.800', '0.1272', '1.800', '0.0814', '7.000', '0.7083', 1, 1, 1, 1, 1724339675.5040658]
VI_after__Init : ['1.201', '0.1950', '1.800', '0.1272', '1.802', '0.0763', '7.000', '0.7079', 1, 1, 1, 1, 1724339683.73941]
VI_at__the_End : ['1.202', '0.4859', '1.800', '0.1325', '1.800', '0.1092', '7.000', '0.7087', 1, 1, 1, 1, 1724339751.7921743]