TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_48_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-016-006-06 | FUSED_ID : 6359364768384483430
  IC_TEMP :  -58.01 | VDDM : 1100.47 | AUX_INT :   -7.39 | CsaBias :   67.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11036e-03 / 2
  ADC_P0  : -7.38948e-03 ± 2.25475e-02
  ADC_P1  : 8.35684e-03 ± 5.49183e-04
  ADC_P2  : -6.18504e-06 ± 2.63632e-06
  CSA_Chi2/NDF : 1.08964e-04 / 2
  CSA_P0  : 5.74550e-02 ± 6.96247e-03
  CSA_P1  : 9.09855e-03 ± 5.24572e-04
  CSA_P2  : -3.87985e-05 ± 7.98861e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [7, 25, 34, 40, 44, 45, 46, 48, 50, 54, 56, 66, 85, 98, 102, 105, 117, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [23, 35, 39, 51, 54, 61, 74, 96, 105, 118, 119, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2862', '1.800', '0.1680', '1.799', '0.0937', '7.000', '0.7074', 1, 1, 1, 1, 1724341681.8867087]
VI_after__Init : ['1.202', '0.2864', '1.800', '0.1680', '1.800', '0.0879', '7.000', '0.7075', 1, 1, 1, 1, 1724341689.9281752]
VI_at__the_End : ['1.202', '0.4731', '1.800', '0.1345', '1.800', '0.1121', '7.000', '0.7082', 1, 1, 1, 1, 1724341757.947237]