TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_51_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-016-008-06 | FUSED_ID : 6359364768384483462
  IC_TEMP :  -55.97 | VDDM : 1126.54 | AUX_INT :   -7.39 | CsaBias :   71.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.43491e-04 / 2
  ADC_P0  : -7.38991e-03 ± 2.08050e-02
  ADC_P1  : 7.98290e-03 ± 4.93966e-04
  ADC_P2  : -4.84359e-06 ± 2.32786e-06
  CSA_Chi2/NDF : 1.64112e-04 / 2
  CSA_P0  : 5.90687e-02 ± 8.54462e-03
  CSA_P1  : 1.00216e-02 ± 6.43776e-04
  CSA_P2  : -4.89322e-05 ± 9.80394e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [8, 16, 35, 39, 48, 58, 65, 72, 81, 100, 110, 113, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [7, 10, 13, 16, 34, 40, 48, 53, 59, 60, 79, 89, 100, 115, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4013', '1.800', '0.1348', '1.800', '0.0891', '7.000', '0.7072', 1, 1, 1, 1, 1724341873.3019109]
VI_after__Init : ['1.202', '0.4017', '1.800', '0.1349', '1.800', '0.0834', '7.000', '0.7069', 1, 1, 1, 1, 1724341881.370317]
VI_at__the_End : ['1.202', '0.4926', '1.800', '0.1377', '1.799', '0.1106', '7.000', '0.7083', 1, 1, 1, 1, 1724341940.8019085]