TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_52_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-016-009-06 | FUSED_ID : 6359364768384483478
  IC_TEMP :  -58.19 | VDDM : 1111.35 | AUX_INT :  -11.38 | CsaBias :   71.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.38916e-03 / 2
  ADC_P0  : -1.13832e-02 ± 3.32273e-02
  ADC_P1  : 8.35460e-03 ± 8.02267e-04
  ADC_P2  : -5.79827e-06 ± 3.86767e-06
  CSA_Chi2/NDF : 1.62520e-04 / 2
  CSA_P0  : 5.98405e-02 ± 8.50307e-03
  CSA_P1  : 9.81568e-03 ± 6.40645e-04
  CSA_P2  : -4.87880e-05 ± 9.75626e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [5, 13, 20, 34, 56, 78, 81, 101, 108, 110, 121, 125, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [14, 16, 28, 42, 52, 56, 60, 66, 69, 72, 73, 88, 89, 92, 96, 100, 105, 121, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2228', '1.800', '0.1405', '1.800', '0.0908', '7.000', '0.7075', 1, 1, 1, 1, 1724341969.2298236]
VI_after__Init : ['1.202', '0.2228', '1.800', '0.1405', '1.800', '0.0849', '7.000', '0.7073', 1, 1, 1, 1, 1724341977.9842188]
VI_at__the_End : ['1.202', '0.4816', '1.800', '0.1352', '1.802', '0.1117', '7.000', '0.7081', 1, 1, 1, 1, 1724342036.8158998]