TEST_NAME : Wafer
TEST_DATE : 24_08_22-17_54_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-016-010-06 | FUSED_ID : 6359364768384483494
  IC_TEMP :  -55.88 | VDDM : 1121.97 | AUX_INT :  -10.64 | CsaBias :   80.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.78524e-03 / 2
  ADC_P0  : -1.06390e-02 ± 2.86967e-02
  ADC_P1  : 8.36575e-03 ± 7.05333e-04
  ADC_P2  : -5.12974e-06 ± 3.47959e-06
  CSA_Chi2/NDF : 1.87730e-04 / 2
  CSA_P0  : 6.02076e-02 ± 9.13879e-03
  CSA_P1  : 1.07908e-02 ± 6.88542e-04
  CSA_P2  : -5.89266e-05 ± 1.04857e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [4, 21, 23, 36, 66, 75, 76, 78, 81, 95, 99, 122, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [0, 18, 21, 28, 53, 65, 67, 75, 76, 84, 96, 98, 102, 105, 108, 109, 119, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2650', '1.800', '0.1465', '1.800', '0.0863', '7.000', '0.7073', 1, 1, 1, 1, 1724342065.0867403]
VI_after__Init : ['1.202', '0.2649', '1.800', '0.1465', '1.800', '0.0835', '7.000', '0.7072', 1, 1, 1, 1, 1724342073.8921778]
VI_at__the_End : ['1.202', '0.4989', '1.800', '0.1387', '1.801', '0.1116', '7.000', '0.7079', 1, 1, 1, 1, 1724342132.9158282]