TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_00_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-016-014-06 | FUSED_ID : 6359364768384483558
  IC_TEMP :  -51.70 | VDDM : 1108.22 | AUX_INT :   -8.68 | CsaBias :   79.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31127e-03 / 2
  ADC_P0  : -8.68024e-03 ± 2.45952e-02
  ADC_P1  : 8.05105e-03 ± 5.94787e-04
  ADC_P2  : -4.33355e-06 ± 2.87300e-06
  CSA_Chi2/NDF : 1.50219e-04 / 2
  CSA_P0  : 6.13500e-02 ± 8.17494e-03
  CSA_P1  : 1.00638e-02 ± 6.15923e-04
  CSA_P2  : -5.13834e-05 ± 9.37977e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [17, 18, 20, 22, 25, 48, 68, 71, 83, 91, 93, 95, 107, 109, 120, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [8, 14, 37, 41, 42, 44, 54, 56, 57, 82, 85, 86, 87, 106, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3410', '1.800', '0.1519', '1.799', '0.0868', '7.000', '0.7072', 1, 1, 1, 1, 1724342448.144423]
VI_after__Init : ['1.202', '0.3410', '1.800', '0.1519', '1.801', '0.0810', '7.000', '0.7074', 1, 1, 1, 1, 1724342456.3059561]
VI_at__the_End : ['1.201', '0.4874', '1.800', '0.1378', '1.803', '0.1104', '7.000', '0.7081', 1, 1, 1, 1, 1724342516.8353596]