TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_03_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-016-016-01 | FUSED_ID : 6359364768384483585
  IC_TEMP :  -55.09 | VDDM : 1124.35 | AUX_INT :   -6.72 | CsaBias :   80.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.19143e-04 / 2
  ADC_P0  : -6.72053e-03 ± 2.05435e-02
  ADC_P1  : 7.95275e-03 ± 4.88756e-04
  ADC_P2  : -4.76746e-06 ± 2.30113e-06
  CSA_Chi2/NDF : 1.22028e-04 / 2
  CSA_P0  : 5.81307e-02 ± 7.36804e-03
  CSA_P1  : 9.83646e-03 ± 5.55129e-04
  CSA_P2  : -4.70476e-05 ± 8.45395e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [3, 11, 16, 19, 35, 50, 59, 80, 104, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [7, 40, 43, 77, 91, 94, 108, 111, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1622', '1.800', '0.1451', '1.799', '0.0859', '7.000', '0.7081', 1, 1, 1, 1, 1724342638.931332]
VI_after__Init : ['1.202', '0.1624', '1.800', '0.1452', '1.800', '0.0786', '7.000', '0.7072', 1, 1, 1, 1, 1724342646.924645]
VI_at__the_End : ['1.201', '0.4871', '1.800', '0.1330', '1.803', '0.1115', '7.000', '0.7080', 1, 1, 1, 1, 1724342713.6167915]