TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_08_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-016-019-01 | FUSED_ID : 6359364768384483633
  IC_TEMP :  -53.39 | VDDM : 1128.54 | AUX_INT :   -8.89 | CsaBias :   72.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45870e-03 / 2
  ADC_P0  : -8.89317e-03 ± 2.58990e-02
  ADC_P1  : 8.14346e-03 ± 6.17028e-04
  ADC_P2  : -5.46288e-06 ± 2.91817e-06
  CSA_Chi2/NDF : 1.04997e-04 / 2
  CSA_P0  : 5.93457e-02 ± 6.83456e-03
  CSA_P1  : 9.64990e-03 ± 5.14934e-04
  CSA_P2  : -4.36069e-05 ± 7.84184e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [9, 31, 33, 35, 40, 42, 53, 65, 74, 75, 102, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [19, 29, 48, 80, 87, 102, 103, 107, 111, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3710', '1.800', '0.1518', '1.800', '0.0879', '7.000', '0.7075', 1, 1, 1, 1, 1724342925.427962]
VI_after__Init : ['1.201', '0.3711', '1.800', '0.1518', '1.800', '0.0821', '7.000', '0.7072', 1, 1, 1, 1, 1724342933.5041974]
VI_at__the_End : ['1.201', '0.4906', '1.800', '0.1343', '1.803', '0.1098', '7.000', '0.7080', 1, 1, 1, 1, 1724342993.124436]